Defect Detection & Review

AST’s extensive experience and expertise in developing state-of-the-art inspection systems combined with advanced IR imaging technology has positioned AST as a leader in providing Automated Inspection / Defect Detection systems to VCSEL manufacturers.  AST ability to utilize this advanced imaging technology enables our customers to perform critical inspection on optical apertures with a high degree of clarity and sensitivity

These advanced system solutions provide optimum inspection capability using NIR (visible – 1050nm) through SWIR (900nm – 1700nm) wavelengths leveraging proprietary optical configurations to achieve the highest quality image performance for defect detection & classification.      

AST’s advanced inspection system platforms range from enhanced high-volume UPH performance capable of ultra-high speed image capture capability enabling high-resolution images to be captured & processed using AI (machine learning) and/or other advanced defect detection algorithms.

Products

Advanced Inspection System

AST-300

 The AST-300 integrates best-in-class precision positioning capability within a highly flexible system that provides an optimum platform for integrating AST’s advanced imaging systems.   These systems provide the required performance and precision to capture on-the-fly images, stitch them into a single high-resolution composite image and singulate those images for processing through AST’s advanced ScopeViewer defect detection software suite.  

Data can be output through SECS GEM or other factory information systems enabling report generation, process control, and other factory, process, and product metrics to be tracked. 

Advanced Inspection & Metrology System

AST-200 / 300H

High-performance system designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. Can be configured as a dedicated production tool or as a versatile process development system.  The system provides the ability to sort / bin wafers per defined criteria.

This automated and versatile platform can be configured with specialized optical paths across the spectrum utilizing precise part staging. The system offers significant and unique advantages for dual production/engineering use and provides the perfect solution when both defect detection and dimensional metrology are required.

The system can be configured or customized to meet your exact requirements with a variety of optical and illumination accessories, custom wafer/part fixtures, as well as custom operator interface, data formats and reports.

Questions?

All of our systems can be fully customized to meet your requirements. If you have questions about our product offerings or capabilities, please contact us for more information.