These solutions address specific assembly and integration requirements and are therefore application and customer specific. AST would be happy to review your requirements and specifications and determine if the application is a good fit for AST’s capabilities. If the assembly and/or integration requirements are deemed a good fit, AST’s experience in developing application / process specific automation will be fully-utilized as we work collaboratively across our respective engineering teams.
Please contact AST for more information regarding engagement & collaboration.
Mid Wave Infrared Inspection System
Detection of thermally identifiable defects either visually or thermo-graphically with the MWIR band (3-5 microns). Magnifications from Macro to 1x, 2.5x, 4x and 5x. Precision 0.10µm resolution 200mm travel motorized stage for accurate navigation and metrology capability.
Thermal detection to 20 mK. Self-contained workstation with probe platforms on both sides of stage. Includes image analysis and enhancement features for optimum detection capability with the ability to stitch images on larger sample sizes while maintaining full resolution.
AST can customize the configuration per your application requirements. This technology also provides advantages and solutions for medical devices, semiconductor, and forensic; materials and processes development and analysis.
Mid Wave Benchtop Infrared Microscope for Defect Detection and Analysis
Provides similar detection of thermally identifiable defects with the MWIR band (3-5 microns). Equivalent magnifications from Macro to 1x, 2.5x, 4x and 5x. The platform utilizes a benchtop configuration with precision 150mm travel manual coarse and fine positioning X-Y stage enabling navigation and metrology functionality.
All of our systems can be fully customized to meet your requirements. If you have questions about our product offerings or capabilities, please contact us for more information.