Manual to fully automated solutions for your most demanding inspection and metrology applications See All Products

Providing creative solutions for Inspection, Metrology, and Infrared Imaging.

 

Advanced Spectral Technology, Inc. (AST) provides manual to fully automated precision motion controlled systems, utilizing application specific optical designs and sensors in any of the Infrared, Visible and UV spectrums. AST employs the latest cutting edge technologies and expertise to solve the industry's most challenging defect detection, inspection, infrared imaging, and metrology requirements. AST additionally serves industries that require semiconductor wafer inspection, thermography, and atmospheric plasma surface preparation.

 

While we primarily serve the Semiconductor/MEMS, Aerospace & Defense, and Medical fields, we're continually seeking to meet the needs of all industries which require creative and innovative solutions to their most diverse applications.

Advanced Spectral Technology, Inc. is an ISO 9001:2015 certified company.
Click to view ISO certificate >> PDF that links to file ISO 9001:2015 Certificate

Product Applications
Defect Inspection

Defect inspection and detection is a vital step in the production of critical compoments, such as those used in the aerospace, medical, and semiconductor/MEMS industries. AST carries a full line of systems specifically designed for inspection, defect detection and fault analysis. Additionally, AST can customize our systems to accommodate your specific requirement.

Recommended Systems:

  • AST-200 Advanced Defect Inspection & Metrology System
  • AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
  • AST-M200C Mid Wave Infrared Inspection System
  • AST-S200T Short Wave Infrared Microscope System
  • AST-230M Ergonomic Metrology Workstation
  • AST-M150T Mid Wave Infrared Microscope for Defect Detection & Analysis
  • uScope
  • Customized Z-Scopes for all your inspection and measurement requirements

Metrology

Metrology is a post-process series of measurements by which manufactured parts are checked and verified for overall consistency. Many industries, such as aerospace, must maintain tight tolerances and shapes for their components, and the science of metrology is an indispensable part of their production process. AST employs the highest quality materials and components in their metrology systems, which ensure accuracy in your mission-critical products.

Recommended Systems:

  • AST-200 Advanced Defect Inspection & Metrology System
  • AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
  • AST-230M Ergonomic Metrology Workstation
  • Customized Z-Scopes for all your inspection and measurement requirements

Infrared & Thermal Imaging

Allows defect inspection and metrology within materials transparent to the infrared wavelengths being used. Thermal Imaging detects infrared radiation emitted by all objects above absolute zero according to the black body radiation law. Thermography makes it possible to see one's environment with or without visible illumination, allowing one to see variations in temperature.

Recommended Systems:

  • AST-200 Advanced Defect Inspection & Metrology System
  • AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
  • AST-M200C Mid Wave Infrared Inspection System
  • AST-S200T Short Wave Infrared Microscope System
  • AST-M150T Mid Wave Infrared Microscope for Defect Detection & Analysis
  • uScope
  • Customized Z-Scopes for all your inspection and measurement requirements

Plasma Surface Preparation

Because oxides and organic contaminants can compromise certain production processes, such as solder bonding, wire bonding, thin film deposition, and plating, it is critical to have a substrate that is properly cleaned of contaminants and ready to accept these subsequent processes. AST provides industry with the Ontos7, a plasma-based surface cleaning and preparation system, with zero hazardous byproducts or waste.

Recommended Systems:

  • Setna Ontos7 Atmospheric Plasma for Surface Preparation