AST-MWIR Workstation
Mid-Wave Infrared Inspection & Analysis System
The AST-MWIR provides the ability to detect defects in power semiconductors, including packaged-level dies that are well matched in the 3-5µm temperature range, where these power devices typically operate, providing good thermal contrast for inspection and detecting surface & sub-surface defects.
Product Highlights
MWIR is highly effective as a non-contact diagnostic tool for quickly identifying where thermal problems are occurring. Our MWIR thermography provides a good solution for performing package-level reliability testing & hot-spot location on a macro-scale detecting defective cells, damaged bond wires, voids in die attach, or localized shorts that produce visible hot regions (hot spot detection).
In-line inspection of power modules, busbars, or assemblies under load, where IR thermography provides a solution for rapid fault localization and analysis using our ScopeViewer™ software to flag abnormal heating & defect detection.
Applications
- Detection of Thermally Identifiable Defects within the Mid-Wave 3-5µm IR Band
- Thermal Detection to 20 mK
- Thermal Imaging Hot Spot Detection in Power Semiconductors, Modules, & Devices
- MWIR Thermography Solutions for Package-level Reliability Testing & Rapid Fault Localization
- Process & System Monitoring: Inline Inspection of Power Modules, Busbars, or packaged power chips & assemblies under load to flag abnormal heating
- Thermo Graphic Applications in Semiconductor, Medical Devices, Aerospace, & Material Sciences
Full Specifications
- Thermographic Microscope for detection of defects using MWIR band (3-5 microns)
- Thermal detection to 20 mK
- Fully integrated & self-contained workstation with dual probe platforms
- Supports “Black Body” option for enhanced sub-surface defect detection
- Advanced system & image analysis software
- InSb FPA on a closed cycle dewar (no LN2 required)
- Magnifications from macro to 1x, 2.5x, 4x, 5x, and 8x
- Spatial resolution below 10 microns
- (Optional) “Lock-In Thermography” option available to detect weak thermal signals for capturing subtle subsurface defects
- (Optional) Cooled MWIR camera (InSb/MCT) option for high frame rate & detection sensitivity
- 200mm x 200mm Travel Precision X-Y Stage, Motorized
- 150mm Travel Z-axis, Motorized
- Workstation Rack-Mount Computer with ScopeViewer™ Software
- Integrated Probe Platforms on each side of X-Y Stage
- Magnification from Macro to 1x, 2.5x, 4x, 5x, and 8x
- InSb FPA on a closed cycle dewar (no LN2 required)
- Cooled InSb/MCT MWIR camera is optional
- ScopeViewer3 Software Application Suite
- Flexible Part-Programming
- Advanced Vision Tools & Metrology Features
- Full Recipe Control of all Imaging Functions
- Recipe Generation in Python Layer
Contact Sales
Our metrology systems can be fully customized to meet your requirements. If you have questions about our product offerings or capabilities, please contact us for more information.