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Advanced Spectral Technology Inc. Creative Solutions for Inspection, Metrology, and Infrared Imaging

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Inspection, Metrology, and Plasma Surface Preparation

AST-200H Advanced Inspection & Metrology System with Wafer Handling

AST-200H

Advanced Inspection & Metrology System with Wafer Handling

The AST-200H is designed for applications where high-speed defect detection and precision measurements are required. It features a powerful set of automated as well as semi-automatic optical/video tools optimized for high accuracy, production throughput, and ease of use.

AST-200 AST-200H Advanced Inspection & Metrology System

AST-200

Advanced Defect Inspection & Metrology System

The AST-200 is designed for applications where high-speed defect detection and precision measurements are required. It features a powerful set of automated as well as semi-automatic optical/video tools optimized for high accuracy, production throughput, and ease of use.

AST-M200C Mid Wave (MWIR) Infrared Inspection System for defect detection and analysis

AST-M200C

Mid Wave Infrared Inspection System

The AST-M200C is a Mid Wave Infrared platform designed for defect detection and analysis. It is a universal configuration for applications in many different market segments.

AST-230M Ergonomic Metrology Workstation  for defect detection and analysis

AST-230M

Ergonomic Metrology

Workstation

The AST-230M is an easy to use metrology workstation with a range of recipe controlled illuminations to accommodate even the most challenging measurements.

AST-S200T Short Wave (SWIR) Infrared Microscope for inspection

AST-S200T

Short Wave Infrared Microscope

The AST-S200T is used for subsurface observation, imaging, verification and inspection of materials transparent to the Near Infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

AST-M150T Mid Wave (MWIR) Infrared Microscope for Defect Detection and Analysis

AST-M150T

Mid Wave Infrared Microscope for Defect Detection and Analysis

The AST-M150T is a Mid Wave Infrared Bench Top Microscope for defect detection and analysis. It is a universal configuration that includes powerful software to accommodate a large variety of cross market applications.

uScope Small Format Standard and Right Angle Viewing Microscope

uScope

Small Format Standard and Right Angle Viewing Microscope

The uScope is a Desktop Microscope System with integrated coaxial White LED (Brightfield) illumination, motorized focus stage with 50mm travel, variable speed mouse driver, and manual XY stage. Includes power supplies for illuminator and motorized focus stage.

Setna Ontos7 Atmospheric Plasma for Surface Preparation

Setna Ontos7

Atmospheric Plasma for Surface Preparation

Process engineers know that native oxides and organic contamination on surfaces can disrupt subsequent processes such as solder bonding, wire bonding, thin film deposition, hybrid assembly, etc. Ontos7 provides a rapid atmospheric process which reduces these contaminates.

AST Macro

Imager

Fast, High-Resolution

Imaging System

The AST Macro Imager is suitable for a wide variety of applications, and is highly customizable to your specific needs.

AST

Autocollimator

Highly Flexible

Angle Measurement System

Autocollimator Systems offer users a user-friendly, highly flexible angle measurement system with features not available from other attitude measurement systems.

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